|
CS 5431 Advanced Computer Architecture
Spring
2012 Topics |
|
1. Available Parallelism and Parallel Architectures Functional Parallelism Course grain parallelism Fine grain parallelism Data Parallelism Flynn's classification Review of data and function parallel architectures. Exploiting Parallelism using replication Exploiting Parallelism through pipelining.
|
|
2. Fundamental Issues in Parallel Processing Synchronization Communication Data dependencies and their relation to fundamental issues Limits of data dependencies Limits of control dependencies
|
|
3. Exploiting Fine Grain Parallelism VLIW and EPIC Architectures Microprogramming VLIW and Compiling for VLIW Architectures EPIC architecture Superscalar Architectures Processor states Parallel Decoding Parallel instruction issue Shelving and dataflow Alternative solutions to shelving Parallel instruction execution Preserving sequential consistency and exception behavior Reorder buffer Future file Checkpoint recovery Renaming and its interaction with state management The fetch problem Prediction and its limits Predication and its limits Memory dataflow Speculation of dependencies through memory Multi-Threading Von-Neumann approaches to multi-threading Dataflow approaches to multi-threading
|
|
4. Exploiting Coarse Grain Parallelism |
Reference books :1. Advanced Computer Architectures A Design Space Approach Dezso Sima, Terence Fountain and Peter Kacsuk 2. Superscalar Processors Mike Johnson 3.Processor Architecture From Dataflow to Superscalar and Beyond Kurij Silc Borut Robic Theo Ungerer 4. MODERN PROCESSOR DESIGN: Fundamentals of Superscalar Processors, John Shen & Mikko Lipasti
|
GradingTerm paper 30 % Presentation 20 % Midterm 1 25 % Midterm 2 25 % The final grade will be calculated using a sliding scale using the percentages above.
|
Collaboration Policy:
You are NOT allowed to work in groups. |
Exam policy: I trust you will always work on your own during the exams. If you happen to study for the exam together with other people, make sure that you sit at the opposite corners of the classroom during the exam. |